The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2006

Filed:

Mar. 03, 2003
Applicants:

Akbar Monfared, Placerville, CA (US);

Steve Mastoris, El Dorado Hills, CA (US);

Michelle Cavanna, Rocklin, CA (US);

Inventors:

Akbar Monfared, Placerville, CA (US);

Steve Mastoris, El Dorado Hills, CA (US);

Michelle Cavanna, Rocklin, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05F 1/66 (2006.01);
U.S. Cl.
CPC ...
Abstract

A voltage margin testing blade is adapted for use in a bladed server having at least one internal adjustable power supply. The testing blade is further adapted to provide a control signal to the power supply indicative of any desire to modify the output voltage of the power supply. The testing blade senses the output voltage of the power supply and compares it to a desired power supply voltage. The control signal is generated in response to this comparison in order to control the actual power supply voltage at or about the desired power supply voltage.


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