The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2006
Filed:
Apr. 23, 2002
Christopher K Sutton, Everett, WA (US);
Christopher K Sutton, Everett, WA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
An electronic test system that distinguishes erroneous and marginal results. The test system includes a memory and an electronic processor for controlling the execution of the test, obtaining test results and generating test results. The test results include a determination of whether the condition of the test datapoints is pass, fail, error or marginal, where pass indicates that the DUT has met a specification, fail indicates that the DUT has not met the specification, error indicates that the test system or interface to the DUT has failed, and marginal indicates that the system is marginally within specification. The test results are displayed on a graphical user interface. The test system provides the ability to control the progress of the test system based on the results. For example, the system can be programmed to stop on erroneous results, marginal results, failed results, combinations of the forgoing, or stop after each measurement. When the system stops, a drop-down window appears explaining the reason for the stoppage.