The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2006
Filed:
Nov. 21, 2002
David Livingston Smith, Rochester, MN (US);
Donald Earl Vosberg, Rochester, MN (US);
Douglas Michael Zuercher, Byron, MN (US);
David Livingston Smith, Rochester, MN (US);
Donald Earl Vosberg, Rochester, MN (US);
Douglas Michael Zuercher, Byron, MN (US);
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Abstract
An apparatus, program product and method of mapping defects on a data storage medium analyze one or more previously-identified defects on a storage medium to detect any growth in those defects over time, such that any detected growth of a previously-identified defect can be accommodated for through the dynamic remapping of additional surface area adjacent the defect to one or more replacement regions located elsewhere on the storage medium. As such, any buffer regions defined around pre-existing defects are effectively maintained as those defects grow over time, thus maintaining suitable protection from data loss that would otherwise result from an attempt to store information in a region that has been impinged upon as a result of the growth of an adjacent defect.