The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7047230 B1

PDF
Full Text
Expired
Date of Patent:
May. 16, 2006

Filed:

Sep. 09, 2002
Applicant:

Phillip B. Gibbons, Pittsburgh, PA (US);

Inventor:

Phillip B. Gibbons, Pittsburgh, PA (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

For use with a database that accommodates distinct value queries having predicates, a distinct sampling system and a method of distinct sampling. In one embodiment, the distinct sampling system includes a scanning subsystem that is configured to scan each row in the database for a distinct target attribute, employ a hash function to map the distinct target attribute to an attribute priority level, maintain random samples of each row based on a sample priority level and a sample size, and produce a distinct sample therefrom. The distinct sampling system further includes a distinct query estimator that is configured to receive the distinct value queries, cause the distinct value queries to be executed on the distinct sample to retrieve a result, and adjust the result to produce a distinct estimate therefrom.


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Gibbons, Phillip. (2006). Distinct sampling system and a method of distinct sampling for optimizing distinct value query estimates (U.S. Patent No. 7047230). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7047230

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