The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2006
Filed:
May. 02, 2001
Alex S. Y. Koh, Austin, TX (US);
Alan Joseph Carlin, Austin, TX (US);
Kenneth Paul Tumin, Austin, TX (US);
Hubert Glenn Carson, Jr., Austin, TX (US);
Alex S. Y. Koh, Austin, TX (US);
Alan Joseph Carlin, Austin, TX (US);
Kenneth Paul Tumin, Austin, TX (US);
Hubert Glenn Carson, Jr., Austin, TX (US);
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
A test pattern generation flow has a stimulus and a device under test (DUT) that operate together through a test bench. The test bench monitors and collects all the data necessary to generate a test program. This information is presented as a captured simulation that allows for ease of generating test software, as well as other simulations such as fault simulation and virtual test simulation. The complete and convenient information can be utilized to automate the development and/or easily manually develop and debug the test software.