The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2006
Filed:
Apr. 26, 1999
Atsushi Maki, Hachioji, JP;
Yuuichi Yamashita, Kawagoe, JP;
Tsuyoshi Yamamoto, Hatoyama, JP;
Hideaki Koizumi, Tokyo, JP;
Atsushi Maki, Hachioji, JP;
Yuuichi Yamashita, Kawagoe, JP;
Tsuyoshi Yamamoto, Hatoyama, JP;
Hideaki Koizumi, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Hitachi Medical Corporation, Tokyo, JP;
Abstract
An optical measurement system for optically measuring a body to be inspected and obtaining an image of a desired item based on information obtained by the measurement includes means for displaying a number of measurement points, means for indicating a light irradiation position and a light detecting position and means for displaying a measurement position and a state of allocating a number to the measurement position. The system further includes means for displaying measuring time sequence data, means for setting a condition of acquiring data, means for displaying a status of acquiring the data, means for instructing control of measurement and means for marking a mark at a position measuring time sequence data.