The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2006

Filed:

Feb. 25, 2002
Applicants:

Atsushi Wada, Kyoto, JP;

Toshihiko Harada, Kyoto, JP;

Inventors:

Atsushi Wada, Kyoto, JP;

Toshihiko Harada, Kyoto, JP;

Assignee:

Arkray, Inc., Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A monitoring system for monitoring the state of a monitoring object apparatus so as to detect a foretoken of failure. A host computer () of a manufacturer/dealer of a clinical check apparatus () receives state data of respective parts from parts sensors () of the clinical check apparatus () of a user and the received state data is compared to a prediction condition stored in a condition storage block () in a state monitoring block (), thereby detecting a foretoken of failure. The prediction condition includes a condition created in accordance with service life of each of the parts and a condition created upon occurrence of a failure in accordance with transition of the state data prior to the occurrence of the failure.


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