The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2006
Filed:
Dec. 23, 2003
James Scott Dyer, Fort Collins, CO (US);
Jerry Ray Halterman, Fort Collins, CO (US);
Gerhard Josef Hunner, Fort Collins, CO (US);
George Bailey Muehlbach, Fort Collins, CO (US);
James Scott Dyer, Fort Collins, CO (US);
Jerry Ray Halterman, Fort Collins, CO (US);
Gerhard Josef Hunner, Fort Collins, CO (US);
George Bailey Muehlbach, Fort Collins, CO (US);
Deere & Company, Moline, IL (US);
Abstract
A method and system of evaluating crop performance facilitates characterization of the environmental impact of a geographic region or areas within the region for growing plant-life. Environmental measurements are obtained. The environmental measurements are associated with a geographic region. Each environmental measurement includes at least one of soil data and weather data. Respective location data is obtained. The location data is associated with corresponding environmental measurements. An estimated performance characteristic is determined for a particular crop planted in the geographic region based on the obtained environmental measurements and respective location data. Contours are established for one or more uniform performance areas with generally uniform performance characteristic within the geographic region by applying a decision-tree analysis to the obtained environmental measurements.