The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2006

Filed:

Jan. 22, 2002
Applicants:

David Hall, Montréal, CA;

Richard Boudreault, Ville St-Laurent, CA;

Pierre A. Beaudry, Pierrefonds, CA;

Inventors:

David Hall, Montréal, CA;

Richard Boudreault, Ville St-Laurent, CA;

Pierre A. Beaudry, Pierrefonds, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The TPSF-based imaging technique uses multiple wavelengths to image an object simultaneously. Acquisition time of an image can be shortened without sacrificing the effective amount or quality of raw imaging data acquired. A plurality of distinguishable wavelengths may be used simultaneously at different injection-detection positions to acquire simultaneously a plurality of TPSF-based imaging data points for the different injection-detection positions. The multiple wavelengths may provide complementary information about the object being imaged.


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