The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2006
Filed:
Oct. 17, 2001
Thomas Bierhoff, Volkmarsen, DE;
Andreas Himmler, Paderborn, DE;
Thomas Bierhoff, Volkmarsen, DE;
Andreas Himmler, Paderborn, DE;
Siemens Aktiengellschaft, Munich, DE;
Abstract
The invention relates to a method for computationally determining optical properties of a channel waveguide, according to which, for an incident ray entering an entrance surface, the distribution of intensity over an emergence surface is determined by adjoined partial rays that possibly split up. From an incident partial ray striking the outer surface, a predetermined algorithm determines a reflected main ray and, in so far as it is necessary according to the ensuing course of events, determines a number of scattered rays of a higher order, which depict partial rays and are recursively traced further. Each partial ray is either a primary ray or a secondary ray. When the incident partial ray is a primary ray, the reflected main ray is a primary ray once again, and the scattered rays are secondary rays. During the reflection of secondary ray, only the reflected main ray is considered as the secondary ray.