The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2006
Filed:
Nov. 09, 2001
Chu-fei Chang, Union City, CA (US);
Yiqing Jin, Hangzhou, CN;
Jie Sun, Fremont, CA (US);
Xing Fan, Chongqing, CN;
Donghui Wu, Hangzhou, CN;
Chu-Fei Chang, Union City, CA (US);
Yiqing Jin, Hangzhou, CN;
Jie Sun, Fremont, CA (US);
Xing Fan, Chongqing, CN;
Donghui Wu, Hangzhou, CN;
ArcSoft, Inc., Fremont, CA (US);
Abstract
Systems and methods for generating three-dimensional models of an object use images having unmeasured camera parameters. Camera calibration determines the perspective of the camera from the content of the images. A background having a pattern with a known marks in each image can facilitate determination of the camera parameters. One background pattern includes separated marks having rectangular sections where corners of the rectangular sections provide calibrations points for the camera parameters. The camera parameters can also be determined by matching features of the object in different images and determining differences in perspective from differences in the appearance of the matched features in different images. A combination of projective and metric reconstructions provides robust reconstruction.