The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2006
Filed:
Apr. 29, 2003
Applicants:
Rainer Danz, Goettingen, DE;
Peter Dietrich, Oberkochen, DE;
Alexander Soell, Waake, DE;
Carsten Hoyer, Juehnde, DE;
Michael Wagener, Goettingen, DE;
Inventors:
Rainer Danz, Goettingen, DE;
Peter Dietrich, Oberkochen, DE;
Alexander Soell, Waake, DE;
Carsten Hoyer, Juehnde, DE;
Michael Wagener, Goettingen, DE;
Assignee:
Carl Zeiss Jena GmbH, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/14 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention is directed to a method of differential interference contrast in which the object is illuminated by natural light and the light coming from the object is first polarized after passing through the objective. The observation is carried out with a shearing interferometer which is known per se.