The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2006

Filed:

Apr. 04, 2001
Applicants:

Matthew G Lopez, Escondido, CA (US);

Jason R Arbeiter, Poway, CA (US);

Michael S Gray, Encinitas, CA (US);

Inventors:

Matthew G Lopez, Escondido, CA (US);

Jason R Arbeiter, Poway, CA (US);

Michael S Gray, Encinitas, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A swath printing system and under/overprinting method compensate for the effects of defective printing elements by adjusting the under/overprinting map used during printing regions of a uniform color, typically black, to minimize the adverse impact on print quality of unprinted 'white space' caused by the defective printing elements. A printing element quality detector determines which printing elements are functional and which are defective. Based on this information, a print controller then selects or constructs an under/overprinting map having under/overprinting pixel positions chosen to reduce these adverse effects on print quality caused by the defective printing elements, thus maintaining high image quality for the printed output.


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