The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2006

Filed:

Mar. 16, 2001
Applicants:

Masatoshi Fujimoto, Hamamatsu, JP;

Shinichiro Aoshima, Hamamatsu, JP;

Makoto Hosoda, Hamamatsu, JP;

Inventors:

Masatoshi Fujimoto, Hamamatsu, JP;

Shinichiro Aoshima, Hamamatsu, JP;

Makoto Hosoda, Hamamatsu, JP;

Assignee:

Hamamatsu Photonics K.K., Shizuoka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 4/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an imaging apparatus, a detection sectiondetects a beam Lhaving passed through an aperturein a first direction and a location designation beam Lhaving passed through the aperturein the opposite direction is made incident to a position (x,y) in a first light image IMon an image pickup surface corresponding to a specific position (x,y) in a second light image IMwhereby the result of detection of the beam Ldetected at the detection sectionindicates data at a specific position in an incoming light image designated by the location designation beam L, regardless of whether there is a mechanical error in movement of the aperture


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