The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2006

Filed:

Oct. 24, 2001
Applicants:

Michihiro Yamagata, Osaka, JP;

Kazutake Boku, Osaka, JP;

Yasuhiro Tanaka, Hyogo, JP;

Tomohiko Sasano, Osaka, JP;

Shusuke Ono, Osaka, JP;

Inventors:

Michihiro Yamagata, Osaka, JP;

Kazutake Boku, Osaka, JP;

Yasuhiro Tanaka, Hyogo, JP;

Tomohiko Sasano, Osaka, JP;

Shusuke Ono, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/00 (2006.01); G02B 5/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device for calculating diffraction efficiencies of a diffraction lens divided into a plurality of regions, each region comprising at least one grating ring, comprises a first memory for storing information about diffraction efficiencies of the regions; a second memory for storing information about weights corresponding to the regions; and a first processor for retrieving information from the first and the second memory, and calculating diffraction efficiencies of the entire diffraction lens using the formula Thus, the diffraction efficiency of the diffraction lens can be calculated easily.


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