The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2006
Filed:
Sep. 25, 2003
Jong Dam Kim, Kyounggi-do, KR;
Hyun Kyu Lee, Seoul, KR;
Yong Jin Cho, Seoul, KR;
See Hwa Jeong, Kyounggi-do, KR;
Jong Dam Kim, Kyounggi-do, KR;
Hyun Kyu Lee, Seoul, KR;
Yong Jin Cho, Seoul, KR;
See Hwa Jeong, Kyounggi-do, KR;
LG. Philips LCD Co., Ltd., Seoul, KR;
Abstract
A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing a substrate to inspect, wherein the substrate includes signal wirings, drive switches and capacitors formed in an effective display area of the substrate; radiating a light onto an inspection switch device and thereby supplying an inspection voltage from an inspection line to one of the drive switches through the signal wirings, so as to charge one of the capacitors; and determining if there is a defect in the effective display area of the substrate by reading the charged voltage of the capacitor.