The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2006
Filed:
Sep. 10, 2002
John Alfred Campin, Orlando, FL (US);
George H. Pettit, Maitland, FL (US);
John Alfred Campin, Orlando, FL (US);
George H. Pettit, Maitland, FL (US);
Alcon RefractiveHorizons, Inc., Fort Worth, TX (US);
Abstract
A system and method for converting measured wavefront data into an ablation profile for correcting visual defects includes providing measured wavefront data on an aberrated eye by a method such as known in the art. The measured wavefront data are correlated with accumulated data on previously treated eyes. Next an adjustment is applied to the measured wavefront data based upon the correlating step. This adjustment is used to form adjusted wavefront data for input to a wavefront data correction algorithm to calculate an ablation profile therefrom. The wavefront data correction algorithm may be modeled as, for example, Zernike polynomials with adjusted coefficients.