The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2006

Filed:

Apr. 27, 2005
Applicants:

Yasushi Goka, Kariya, JP;

Hideki Matsuura, Kariya, JP;

Noboru Kitahara, Hekinan, JP;

Inventors:

Yasushi Goka, Kariya, JP;

Hideki Matsuura, Kariya, JP;

Noboru Kitahara, Hekinan, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 1/68 (2006.01);
U.S. Cl.
CPC ...
Abstract

An airflow meter has a bypass passage disposed in an air passage and a sensing portion disposed in the bypass passage to detect an airflow amount. The bypass passage is provided with a restriction portion to gradually decrease a passage width of the bypass passage in an airflow direction in the bypass passage. The restriction portion includes a first restriction portion and the second restriction portion disposed at an immediately downstream side of a narrowest portion of the first restriction portion. The first restriction portion gradually decreases the passage width in the airflow direction. The second restriction portion increases the passage width than the passage width at the narrowest portion in a stepped manner. The sensing portion is located in a bound in which the restriction portion is disposed.


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