The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2006
Filed:
Dec. 09, 2002
Applicants:
Pascal Jordil, Ecoteaux, CH;
Charles-henri Zufferey, Erde, CH;
Adriano Zanier, Prilly, CH;
Inventors:
Assignee:
Tesa SA, Renens, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 3/30 (2006.01); G01B 3/32 (2006.01);
U.S. Cl.
CPC ...
Abstract
Reference gauge for calibrating measuring machines whose reference dimension can be measured both on its inner size and by its outer size, thus making it possible to keep the reference dimension less than 15 millimeters, even for calibrating measuring machines equipped with probe tips having a diameter greater than that dimension. The calibration method with the aid of such a reference gauge comprises in certain cases the measuring of the calibrated distance between two outer surfaces of a protruding volume.