The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2006
Filed:
Apr. 25, 2002
Applicant:
James F. Leary, Galveston, TX (US);
Inventor:
James F. Leary, Galveston, TX (US);
Assignee:
Board of Regents, The University of Texas Syxtem, Austin, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A data analysis system and/or method, e.g., a data mining/data exploration method, using subtractive clustering is used to explore the similarities and differences between two or more multi-dimensional data sets, e.g., generated using a flow cytometer, an image analysis system, gene expression, or protein microarrays.