The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2006
Filed:
Apr. 15, 2005
Yuichi Takemura, Anjo, JP;
Satoshi Masuda, Kariya, JP;
Masaomi Inoue, Kariya, JP;
Kenji Kasashima, Aichi-ken, JP;
Rihito Kaneko, Aichi-ken, JP;
Yuichi Takemura, Anjo, JP;
Satoshi Masuda, Kariya, JP;
Masaomi Inoue, Kariya, JP;
Kenji Kasashima, Aichi-ken, JP;
Rihito Kaneko, Aichi-ken, JP;
Toyota Jidosha Kabushiki Kaisha, Toyota, JP;
Denso Corporation, Kariya, JP;
Abstract
A plurality of variables representing the characteristics of a knock is obtained from an output signal of a sensor. The variables include a peak value of the knock frequency component in the output signal of the sensor and a waveform correlation coefficient representing the correlation between the waveform of the output signal and an ideal knock waveform, which is the waveform specific to a knock. The peak value and the waveform correlation coefficient are normalized, and a detection distribution is created using the obtained normalized data values. A correlation coefficient for knock determination representing the correlation between the detection distribution and an ideal knock distribution is calculated. The correlation coefficient for knock determination is compared with a predetermined knock determination threshold value, and the knock determination threshold value is corrected in accordance with the comparison result. As a result, the accuracy and the reliability of knock determination are improved.