The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2006

Filed:

Oct. 15, 2002
Applicants:

Christopher M. Neubauer, Pittsburgh, PA (US);

Jeffrey Niederst, Pittsburgh, PA (US);

David M. Riddle, Irwin, PA (US);

Jeffrey R. Kubala, Glenshaw, PA (US);

Inventors:

Christopher M. Neubauer, Pittsburgh, PA (US);

Jeffrey Niederst, Pittsburgh, PA (US);

David M. Riddle, Irwin, PA (US);

Jeffrey R. Kubala, Glenshaw, PA (US);

Assignee:

Valspar Sourcing, Inc., Minneapolis, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01); G01J 3/42 (2006.01); G01J 3/427 (2006.01); B05D 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method of measuring extent of cure of a coating comprising operating a metal-containing substrate coating operation to provide a coated metal-containing substrate; positioning an investigative apparatus near the coated metal-containing substrate; and operating the investigative apparatus to obtain an extent of cure reading, the reading corresponding to an area on the coated metal-containing substrate.


Find Patent Forward Citations

Neubauer, Christopher. (2006). Method of monitoring extent of cure (U.S. Patent No. 7043326). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7043326

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…