The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7043082 B1

PDF
Full Text
Expired
Date of Patent:
May. 09, 2006

Filed:

Jan. 05, 2001
Applicants:

Kieran Gerard Larkin, Putney, AU;

Michael Alexander Oldfield, Eastwood, AU;

Donald James Bone, Kaleen, AU;

Inventors:

Kieran Gerard Larkin, Putney, AU;

Michael Alexander Oldfield, Eastwood, AU;

Donald James Bone, Kaleen, AU;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/76 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method () of estimating an orientation angle (β) of a pattern in an image () is described. A complex energy operator is applied to the image (). The complex energy operator is defined as Ψ{f}=(D{f})−fD{f}. A phase component of the result, which is defined as 2β=arg(Ψ{f}) is determined, from which the orientation angle (β) is calculated. A method () of demodulating a real two-dimensional pattern is also described. A two-dimensional spiral phase filter is applied to the pattern. The result is combined with the original pattern to provide a demodulated image. Furthermore, a method () of estimating a spatial phase of fringe pattern images in a sequence of fringe patterns is disclosed. The fringe pattern images are converted to pure AMFM patterns by removing offsets from each. Contingent analytic images are determined corresponding to each of said AMFM patterns, from which phase differences and phase shifts are determined from dependent pairs. This allows for a spatial phase of the fringe pattern images to be estimated.


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