The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7042570 B1

PDF
Full Text
Expired
Date of Patent:
May. 09, 2006

Filed:

Jan. 09, 2003
Applicants:

Michael J. Sailor, La Jolla, CA (US);

Sonia Letant, Livermore, CA (US);

Inventors:

Michael J. Sailor, La Jolla, CA (US);

Sonia Letant, Livermore, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2006.01); C12M 1/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for analyzing gaseous or liquid samples is provided. Samples are interacted with pores of a porous thin film. A time-varying response of reflectivity is obtained from the surface of the porous thin film during the interaction. One or more analytes forming the sample or a part of the sample are identified based upon the time-varying response.


Find Patent Forward Citations

Sailor, Michael. (2006). Porous thin film time-varying reflectivity analysis of samples (U.S. Patent No. 7042570). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7042570

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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