The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2006
Filed:
Dec. 27, 2002
Applicant:
Yoshihisa Tani, Nagano, JP;
Inventor:
Yoshihisa Tani, Nagano, JP;
Assignee:
NHK Spring Co., Ltd., Kanagawa, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
To apply a constant pressing force to an object to be tested, so that reliable tests can be performed. A test socketpresses an object to be testedagainst the testing face of a testing device. The present invention comprises
Tani, Yoshihisa. (2006). Socket for inspection (U.S. Patent No. 7042238). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7042238
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile