The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2006
Filed:
Feb. 25, 2003
Applicants:
Jagadish Sharma, Silver Spring, MD (US);
Joseph P. Teter, Mt. Airy, MD (US);
Inventors:
Jagadish Sharma, Silver Spring, MD (US);
Joseph P. Teter, Mt. Airy, MD (US);
Assignee:
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of detecting a defect on a surface of a material due to exposure of the material to incident ionizing radiation, the method comprising the step of:
Sharma, Jagadish. (2006). Inspection of common materials for radiation exposure by atomic and/or magnetic force microscopy (U.S. Patent No. 7041987). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7041987
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile