The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2006
Filed:
Jul. 21, 2004
Applicants:
Andrew R. Bowdler, Walsall, GB;
Emmanuel Raptakis, Bramhall, GB;
Inventors:
Andrew R. Bowdler, Walsall, GB;
Emmanuel Raptakis, Bramhall, GB;
Assignee:
Krates Analytical Limited, , GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01); H01J 49/16 (2006.01);
U.S. Cl.
CPC ...
Abstract
A time of flight (TOF) mass spectrometer includes an ion source which has an extraction lens. The extraction lens has an element with an aperture. The aperture extends through the element to form a through-channel. In use, ions may pass from one side of the element to the opposite side of the element by passing through the through channel. The through channel has a length which is equal to or greater than 8/10 of a diameter of the aperture.