The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2006
Filed:
Jun. 30, 2004
Peter Aptaker, Wantage, GB;
James M. Mckendry, Headington, GB;
Jozef A. W. M. Corver, Nuenen, NL;
The BOC Group, Inc., Murray Hill, NJ (US);
Abstract
A method () for reducing or eliminating the effects of proximate samples on the NMR measurement of the mass of a test sample in a NMR check weighing system () for samples on a production line. The test sample is in a container () on a production line with the plurality of proximate samples each also in a container () on the production line. Method () includes determining cross coupling weighing factors for a plurality of samples in proximity to the test sample, magnetic resonance measuring of the test sample and proximate samples, the step of magnetic resonance measuring of the test sample and proximate samples providing data representative of each measurement; and applying weighing factors to the data representative of each measurement compensating for the proximate sample effects.