The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2006

Filed:

Feb. 07, 2002
Applicants:

Alexander C. Loui, Penfield, NY (US);

Sanjiv Kumar, Pittsburgh, PA (US);

Inventors:

Alexander C. Loui, Penfield, NY (US);

Sanjiv Kumar, Pittsburgh, PA (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for classification of image regions by probabilistic merging of a class probability map and a cluster probability map includes the steps of a) extracting one or more features from an input image composed of image pixels; b) performing unsupervised learning based on the extracted features to obtain a cluster probability map of the image pixels; c) performing supervised learning based on the extracted features to obtain a class probability map of the image pixels; and d) combining the cluster probability map from unsupervised learning and the class probability map from supervised learning to generate a modified class probability map to determine the semantic class of the image regions. In one embodiment the extracted features include color and textual features.


Find Patent Forward Citations

Loui, Alexander. (2006). Method for image region classification using unsupervised and supervised learning (U.S. Patent No. 7039239). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7039239

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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