The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2006
Filed:
Oct. 31, 2002
Applicants:
Fukami Imai, Kariya, JP;
Hisaaki Wakao, Kariya, JP;
Inventors:
Fukami Imai, Kariya, JP;
Hisaaki Wakao, Kariya, JP;
Assignee:
Toyoda Koki Kabushiki Kaisha, Kariya, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02H 5/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
An abnormality detection apparatus, which reduces erroneous detection of an open abnormality of a relay, includes a microcomputer that activates the relay and determines whether the output voltage of the relay is less than a threshold value. When the output voltage is less than the threshold value, the microcomputer repeats the activation of the relay and the determination. The detection unit detects the occurrence of an open abnormality when the repetition number exceeds two.