The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2006
Filed:
Jul. 28, 2005
Yoshinori Morimoto, Kanagawa, JP;
Tadashi Masuda, Kanagawa, JP;
Tsuyoshi Tanabe, Kanagawa, JP;
Kiyoshi Kondou, Kanagawa, JP;
Kenichi Saito, Kanagawa, JP;
Yoichi Suzuki, Kanagawa, JP;
Yoshinori Morimoto, Kanagawa, JP;
Tadashi Masuda, Kanagawa, JP;
Tsuyoshi Tanabe, Kanagawa, JP;
Kiyoshi Kondou, Kanagawa, JP;
Kenichi Saito, Kanagawa, JP;
Yoichi Suzuki, Kanagawa, JP;
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Abstract
A first fθ lens is arranged to form an inclination angle αto a main scanning plane. A second fθ lens is arranged to form an inclination angle α. In order to determine the inclination angles αand α, curvature amounts of scanning lines generated on a scanned surface are measured when the fθ lenses are independently inclined one at a time at a minute angle. Change rates Kand Kare obtained from the measured curvature amounts and the minute angles. The inclination angles αand αare determined such that |KKis no more than a certain value.