The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2006

Filed:

Mar. 28, 2003
Applicants:

Dimitry Gorinevsky, Palo Alto, CA (US);

Tristram T. Hyde, Severna Park, MD (US);

Inventors:

Dimitry Gorinevsky, Palo Alto, CA (US);

Tristram T. Hyde, Severna Park, MD (US);

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measurement system is provided that facilitates the measuring of a shape of a flexible electromagnetic radiation structure. The measurement system includes a plurality of local sensors, a central sensor and a measurement processor. Each of the plurality of local sensors is configured to sense the position of a portion of the flexible electromagnetic radiation structure. The central sensor is configured to determine an overall shape of the flexible electromagnetic radiation structure. The measurement processor provides the ability to combine sensor data from the local sensors and sensor data from the central sensor to provide an accurate measurement of the shape of the flexible electromagnetic radiation structure.


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