The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2006

Filed:

Feb. 21, 2003
Applicant:

James A. Paul, Toledo, OH (US);

Inventor:

James A. Paul, Toledo, OH (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A workpiece testing and marking system includes an apparatus for testing a workpiece and for selectively generating a signal that is representative of a result of the test. The system also includes a marker that is adapted to provide a visual indication on the workpiece. A receptacle is provided for selectively supporting the marker. The receptacle includes a locking mechanism for selectively preventing removal of the marker from the receptacle. A controller is responsive to the test result signal for controlling the operation of locking mechanism. The locking mechanism can include a sensor for generating a signal to the controller when the marker is disposed within the receptacle. If the length of time that the marker is removed from the bore exceeds a predetermined maximum, then the controller can generate a fault or alarm signal to the operator of the testing apparatus.


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