The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2006
Filed:
Sep. 02, 2003
Robert R. Alfano, Bronx, NY (US);
Iosif Zeylikovich, Brooklyn, NY (US);
Wubao Wang, Flushing, NY (US);
Jamal Ali, Brooklyn, NY (US);
Vincent Benischek, Shrub Oak, NY (US);
Yury Budansky, Oakland, NJ (US);
Robert R. Alfano, Bronx, NY (US);
Iosif Zeylikovich, Brooklyn, NY (US);
Wubao Wang, Flushing, NY (US);
Jamal Ali, Brooklyn, NY (US);
Vincent Benischek, Shrub Oak, NY (US);
Yury Budansky, Oakland, NJ (US);
The Research Foundation of the City of New York, New York, NY (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
The present invention provides systems and methods for non-destructively detecting material abnormalities beneath a coated surface, comprising a mid-infrared (MIR) illumination unit for illuminating an area of the coated surface, and an MIR 2-D imager, which includes an MIR CCD or CMOS camera, for capturing an image of a material abnormalities under the illuminated area of the coated surface. In addition, the system may further comprise a scanning unit for moving the system to a next area.