The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2006
Filed:
Mar. 12, 2003
Minoru Miyatake, Ibaraki, JP;
Masahiro Yoshioka, Ibaraki, JP;
Tomoaki Masuda, Ibaraki, JP;
Atsushi Kitagawa, Ibaraki, JP;
Hiroyuki Takao, Ibaraki, JP;
Kaori Shirouzu, Ibaraki, JP;
Minoru Miyatake, Ibaraki, JP;
Masahiro Yoshioka, Ibaraki, JP;
Tomoaki Masuda, Ibaraki, JP;
Atsushi Kitagawa, Ibaraki, JP;
Hiroyuki Takao, Ibaraki, JP;
Kaori Shirouzu, Ibaraki, JP;
Nitto Denko Corporation, Ibaraki, JP;
Abstract
An antireflection layer is formed directly or through an other layer at least on one side of a transparent base film of an antireflection film. The antireflection layer is made of at least two kinds of low refractive index materials satisfying a relationship of refractive index: n≦1.49. The antireflection layer is excellent in antireflection characteristics and mar resistance. When the antireflection layer is formed on a hard coat layer having an uneven surface roughened by particles, the antireflection film is excellent in antiglareness.