The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2006
Filed:
Sep. 25, 2003
Slawomir J. Swillo, Ann Arbor, MI (US);
Kaushik Arjunan Iyer, Newark, DE (US);
Shixin Jack HU, Ann Arbor, MI (US);
Slawomir J. Swillo, Ann Arbor, MI (US);
Kaushik Arjunan Iyer, Newark, DE (US);
Shixin Jack Hu, Ann Arbor, MI (US);
The Regents of the University of Michigan, Ann Arbor, MI (US);
Abstract
A optical system and method of measuring a strain on a surface of a band of a sheet of a material. A single line, or an area having a boundary line, is marked on the band before deformation. The line traverses a width of the band at angle. The band is deformed and an equivalent two-dimensional image of the line after deformation is obtained. The line before deformation is compared with the two-dimensional equivalent image of the line after deformation, and the strain on the surface of the band after deformation is determined.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile