The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2006
Filed:
Jun. 30, 2003
Nadeem N. Eleyan, Austin, TX (US);
Harsh D. Sharma, Austin, TX (US);
Howard L. Levy, Cedar Park, TX (US);
Hong S. Kim, Austin, TX (US);
Nadeem N. Eleyan, Austin, TX (US);
Harsh D. Sharma, Austin, TX (US);
Howard L. Levy, Cedar Park, TX (US);
Hong S. Kim, Austin, TX (US);
Sun Microsystems, Inc., Palo Alto, CA (US);
Abstract
Signal state durations, such as the pulse-width, of on-chip signals are often critical to the successful operation of an integrated circuit. The signal state durations measured by on-chip technology provide signal state duration information to an on-chip signal state duration control system. The signal state duration control system uses the information to adjust the signal state duration of an on-chip signal. In one embodiment, the signal state duration of the on-chip signal is the pulse width of the on-chip signal. The signal duration measurement and adjustment system is, for example, useful for measuring the state duration of signals such as self-resetting signals, which are difficult to externally measure and adjust signal state durations using on-chip technology.