The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2006
Filed:
Jul. 25, 2001
James Andrew Davis, Richmond, VA (US);
Jonathan Jedwab, Bristol, GB;
David H. Mcintyre, Boise, ID (US);
Kenneth Graham Paterson, Teddington, GB;
Frederick a Perner, Palo Alto, CA (US);
Gadiel Seroussi, Cupertino, CA (US);
Kenneth K Smith, Boise, ID (US);
Stewart R. Wyatt, Boise, ID (US);
James Andrew Davis, Richmond, VA (US);
Jonathan Jedwab, Bristol, GB;
David H. McIntyre, Boise, ID (US);
Kenneth Graham Paterson, Teddington, GB;
Frederick A Perner, Palo Alto, CA (US);
Gadiel Seroussi, Cupertino, CA (US);
Kenneth K Smith, Boise, ID (US);
Stewart R. Wyatt, Boise, ID (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
A magnetoresistive solid-state storage device (MRAM) employs error correction coding (ECC) to form ECC encoded stored data. In a read operation, parametric values are obtained from storage cellsof the device and compared to ranges to establish logical bit values, together with erasure information. The erasure information identifies symbolsin a block of ECC encoded datawhich, from the parametric evaluation, are suspected to be affected by physical failures of the storage cells. Where the position of suspected failed symbolsis known from this erasure information, the ability of a decoderto perform ECC decoding is substantially enhanced.