The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2006

Filed:

Nov. 27, 2002
Applicants:

Charles Earl Markham, Appleton, WI (US);

Douglas Gordon Barron Barber, Appleton, WI (US);

John Harland Hise, Neenah, WI (US);

Sheryl Annette Ihde, Greenville, WI (US);

Jeffrey Dean Lindsay, Appleton, WI (US);

Kurt Sigurd Nygaard, Appleton, WI (US);

Michael Roy Pokorny, Neenah, WI (US);

Michael T. Price, Oshkosh, WI (US);

Walter Caswell Reade, Appleton, WI (US);

Gregory Duncan Shaffer, Neenah, WI (US);

Roger Dale Yosten, Sumner, TX (US);

Inventors:

Charles Earl Markham, Appleton, WI (US);

Douglas Gordon Barron Barber, Appleton, WI (US);

John Harland Hise, Neenah, WI (US);

Sheryl Annette Ihde, Greenville, WI (US);

Jeffrey Dean Lindsay, Appleton, WI (US);

Kurt Sigurd Nygaard, Appleton, WI (US);

Michael Roy Pokorny, Neenah, WI (US);

Michael T. Price, Oshkosh, WI (US);

Walter Caswell Reade, Appleton, WI (US);

Gregory Duncan Shaffer, Neenah, WI (US);

Roger Dale Yosten, Sumner, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

Providing quality management and intelligent manufacturing with labels and smart tags in event-based product manufacturing. Some of the disclosed embodiments include a system, method, and computer-readable media for storing, during a process, data associated with a material. Also disclosed are a method of collecting, storing, and reporting machine productivity, waste, and delay information on an event basis in a manufacturing system, a method of capturing and storing material history, a method of automating tracking of positions of components used in a process and correlating portions of a component with production problems, an improved inventory management system, and a method of tracking and recording actions of specific operators of a process performed by a machine. The embodiments are operable in an intelligent manufacturing system including a process for converting raw materials to a product, a process control system including one or more sensors capable of generating an alarm in response to an event that results in one of waste, machine delay, or decrease product quality, a data logger associated with the process control system for obtaining event parameters associated with the event, a database on a server for recording event parameters obtained by the data logger, and a reporting system cooperatively associated with the database for reporting productivity parameters regarding the process derived at least in part from the event parameters.


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