The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2006
Filed:
Aug. 25, 2004
Gregory Link, Canton, MI (US);
Raghunandan Sridhara, Canton, MI (US);
Youssef Hamidieh, Bloomfield, MI (US);
Mark Malburg, Columbus, IN (US);
Gregory Link, Canton, MI (US);
Raghunandan Sridhara, Canton, MI (US);
Youssef Hamidieh, Bloomfield, MI (US);
Mark Malburg, Columbus, IN (US);
Ford Motor Company, Dearborn, MI (US);
Abstract
A method for analyzing waviness of a surface. The method includes measuring a height of the surface, producing a set of data points indicative of a waviness profile, selecting a subset of the set of data points, calculating a waviness height of the subset, repeating the selecting, determining, and calculating steps for additional subsets until all members of the set of data points have been selected, and selecting a maximum waviness height value from the waviness heights calculated for each subset. The height of the surface may be measured over a distance longer than the length over which waviness assessment is required.