The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2006
Filed:
Jan. 04, 2005
Yasuhiko Iguchi, Tokyo, JP;
Hiroshi Tamura, Tokyo, JP;
Mitsuhiro Enokida, Tokyo, JP;
Earl Louis Dombroski, Rio Rancho, NM (US);
Thomas Robert Claus, Albuquerque, NM (US);
Yasuhiko Iguchi, Tokyo, JP;
Hiroshi Tamura, Tokyo, JP;
Mitsuhiro Enokida, Tokyo, JP;
Earl Louis Dombroski, Rio Rancho, NM (US);
Thomas Robert Claus, Albuquerque, NM (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A semiconductor test data analysis system () automatically recording, during an analysis operation, operation information of the analysis operation, including analysis conditions or an analysis procedure for input test data, or analysis information obtained by the analysis operation. The analysis system includes a processing means (), an analysis target data storage means (), which stores the test data as analysis target data, a historical data storage means (), which stores as historical data either operation information of the analysis operation or analysis information obtained by the analysis operation, and a display data storage means (), which stores analysis information obtained by the analysis operation, which stores analysis display data generated by the processing means for the purpose of displaying the analysis information obtained by the analysis operation. In this system, when a new analysis operation is specified, the processing means () processes the input test data in accordance with the analysis operation, and processes at least one of the analysis target data, historical data, and display data by the new analysis operation.