The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2006
Filed:
Jan. 16, 2004
Elida Isabel DE Obaldia, Dallas, TX (US);
Chih-ming Hung, McKinney, TX (US);
Dirk Leipold, Plano, TX (US);
Oren Eliezer, Plano, TX (US);
Elida Isabel de Obaldia, Dallas, TX (US);
Chih-Ming Hung, McKinney, TX (US);
Dirk Leipold, Plano, TX (US);
Oren Eliezer, Plano, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
An on-chip test mechanism for transceiver power amplifier and oscillator frequency for use with the transmitter portion of an integrated RF transceiver. The RF output from the power amplifier in the transmitter is input to a built-in dedicated analog comparator having a configurable threshold. The threshold is adjusted to a predetermined level at which crossings start to occur at the comparator output. The comparator outputs pulses only if the power amplifier output is above a minimum configurable level. The comparator output is input to a frequency divider whose frequency output is tested by a low cost external tester to determine the actual RF frequency thereby confirming generation of the correct oscillator frequency and that the amplitude of the signal at the output of the power amplifier is sufficiently high for the configurable threshold level to be exceeded, thereby determining the compliance of the output power with its defined specifications.