The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2006
Filed:
Jul. 02, 2001
Raymond C. Wallace, San Diego, CA (US);
Jeffrey Bartlett, San Diego, CA (US);
John K. M. Lee, Ramona, CA (US);
Raymond C. Wallace, San Diego, CA (US);
Jeffrey Bartlett, San Diego, CA (US);
John K. M. Lee, Ramona, CA (US);
Qualcomm Inc., San Diego, CA (US);
Abstract
A testing chamber is configured to evaluate the accuracy of a wireless communication device under test in a production environment. The configuration of the testing chamber may resemble an enclosed structure having a wall that includes multiple layers. An array of antennas, which serves as a layer of the wall, is strategically positioned within the testing chamber to receive and transmit signals emitted to/from the wireless communication device. Located within the testing chamber is either a stationary or moveable holder to support the wireless communication device. Furthermore, during testing, the forward link and the reverse communication links are monitored by selectively or alternatively adjusting and shifting the phase/amplitude of the antenna of the wireless communication device to mitigate the effects of multi-path fading.