The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2006
Filed:
Jul. 08, 2002
Alan E. Willner, Los Angeles, CA (US);
Qian Yu, Los Angeles, CA (US);
Zhongqi Pan, Los Angeles, CA (US);
Lianshan Yan, Los Angeles, CA (US);
Alan E. Willner, Los Angeles, CA (US);
Qian Yu, Los Angeles, CA (US);
Zhongqi Pan, Los Angeles, CA (US);
Lianshan Yan, Los Angeles, CA (US);
University of Southern California, Los Angeles, CA (US);
Abstract
Techniques for monitoring frequency-dependent parameter and optical property such as optical dispersion in a modulated optical signal with sidebands based on optical vestigial sideband filtering. Monitoring implementations for both chromatic dispersion and polarization-mode dispersion are described as examples.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile