The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2006
Filed:
Mar. 25, 2002
Machiko Kitayama, Nara, JP;
Masaya Kuwahara, Osaka, JP;
Yasuhiro Tai, Osaka, JP;
Matsushita Electric Industrial Co., Ltd., Kadoma, JP;
Abstract
An offset measuring method is for measuring an offset based on an optical beam reflected by an information medium, in a recording and reproduction apparatus including an optical pickup placed on transportation means so as to be driven along a radial direction of the information medium. The method includes the steps of directing an optical beam toward a first measuring position, thereby measuring a first offset amount based on the optical beam reflected at the first measuring position; moving the transportation means by a first distance in a first direction along the radial direction; driving the optical pickup by a second distance, which is equal to the first distance, in a second direction; and directing an optical beam toward a second measuring position, thereby measuring a second offset amount based on the optical beam reflected at the second measuring position.