The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2006
Filed:
May. 02, 2003
Applicant:
Yumiko Kato, Kanagawa, JP;
Inventor:
Yumiko Kato, Kanagawa, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract
An observation optical system is disclosed with which the Fresnel reflection at the surfaces of optical members can be reduced, the transmittance can be improved, and the surface reflection ghost that occur among a plurality of optical surfaces can be suppressed. The observation optical system of the present invention comprises a plurality of optical surfaces, and a fine periodic structure, with a period smaller than the wavelength of incident light, is provided at an effective optical region of at least one surface among the aforementioned plurality of optical surfaces.