The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2006
Filed:
Apr. 30, 2003
Ko Ishizuka, Omiya, JP;
Hidejiro Kadowaki, Yokohama, JP;
Yasushi Kaneda, Urawa, JP;
Shigeki Kato, Utsunomiya, JP;
Takayuki Kadoshima, Utsunomiya, JP;
Sakae Horyu, Tokyo, JP;
Ko Ishizuka, Omiya, JP;
Hidejiro Kadowaki, Yokohama, JP;
Yasushi Kaneda, Urawa, JP;
Shigeki Kato, Utsunomiya, JP;
Takayuki Kadoshima, Utsunomiya, JP;
Sakae Horyu, Tokyo, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
Interference measuring apparatus for detecting a plurality of different interference phase signals. The apparatus has a light dividing member for dividing linearly polarized light beams superposed one upon another into a plurality of light beams. The apparatus also includes a light transmitting member with a plurality of light passing portions having different light transmitting properties in conformity with the incidence positions of the plurality of light beams divided by the light dividing member. In addition, the apparatus has a polarizing plate to receive the plurality of light beams that passed through the light transmitting member.