The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2006
Filed:
Jun. 26, 2003
Samuel Chen, Penfield, NY (US);
Anthony E. Taddei, Hilton, NY (US);
Joaquin Calcines, West Henrietta, NY (US);
Krishnan Chari, Fairport, NY (US);
Martin C. Kaplan, Rochester, NY (US);
Douglas L. Vizard, Durham, CT (US);
Samuel Chen, Penfield, NY (US);
Anthony E. Taddei, Hilton, NY (US);
Joaquin Calcines, West Henrietta, NY (US);
Krishnan Chari, Fairport, NY (US);
Martin C. Kaplan, Rochester, NY (US);
Douglas L. Vizard, Durham, CT (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
A method of determining one or more color characteristics of a colored microsphere comprising: providing a microarray of microspheres, including at least one colored microsphere which has a color characteristic; producing a magnified optical image of individual microspheres of the microarray; locating a microsphere in the aperture of a spectrometer to confine the color region of interest of the located microsphere in order to determine one or more color characteristics thereof; and determining one or more color characteristics of the located microsphere by means of the spectrometer.