The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2006
Filed:
Jun. 30, 2003
Applicants:
Howard B. Jones, Glastonbury, CT (US);
John H. Bluege, Lake Park, FL (US);
Inventors:
Howard B. Jones, Glastonbury, CT (US);
John H. Bluege, Lake Park, FL (US);
Assignee:
United Technologies Corporation, Hartford, CT (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for detecting defects in metallic parts, comprising the steps of providing a metallic surface comprising a repeating microstructure and at least one surface defect, redirecting an incident light beam off of an area of the metallic surface comprising the at least one surface defect thereby forming a redirected light beam, observing the redirected light beam, detecting at least a portion of the redirected light beam resulting from redirection off of the at least one surface defect.