The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2006
Filed:
Apr. 09, 2004
Je-hyoung Ryu, Suwon, KR;
Tae-gyu Kim, Hwasung, KR;
Jun-ho Lee, Yongin, KR;
Sung-jin Lee, Suwon, KR;
Hong-yong Lee, Suwon, KR;
Je-hyoung Ryu, Suwon, KR;
Tae-gyu Kim, Hwasung, KR;
Jun-ho Lee, Yongin, KR;
Sung-jin Lee, Suwon, KR;
Hong-yong Lee, Suwon, KR;
Samsung Electronics Co., Ltd., Suwon-Si, KR;
Abstract
An inspecting apparatus for a semiconductor device includes a match plate; a contact module combined with the match plate and including a radiator to radiate heat from the semiconductor device to the outside and a tester to contact the leads of the semiconductor device; and a heat pipe provided in the radiator. The inspecting apparatus performs testing at a constant temperature, regardless of heat from the semiconductor device, by transferring the heat quickly and efficiently, thereby producing more accurate test results. The apparatus also improves productivity and saves expense by removing faulty test results caused by incorrectly identifying a qualified semiconductor device as a defective semiconductor device.